• DocumentCode
    753480
  • Title

    Optimization of Low-Voltage Metallized Film Capacitor Geometry

  • Author

    Vuillermet, Y. ; Chadebec, O. ; Lupin, J.M. ; Saker, A. ; Meunier, G. ; Coulomb, J.l.

  • Author_Institution
    ENSIEG, Grenoble
  • Volume
    43
  • Issue
    4
  • fYear
    2007
  • fDate
    4/1/2007 12:00:00 AM
  • Firstpage
    1569
  • Lastpage
    1572
  • Abstract
    Thermal constraint is one of the major cause of capacitor failures. In this paper, a loss model, based on electrode current distribution, is first established to determine, by numerical simulation, a temperature mapping of capacitor. This mapping is successfully compared to measurements. Then a shape optimization, coupling losses computing and finite-element method, is led in order to find parameters that give the best lifespan and the larger reactive power provided. Very interesting new geometries have been found out; they allow an increase in reactive power greater than the increase in volume
  • Keywords
    current distribution; finite element analysis; reactive power; thin film capacitors; capacitor failures; capacitor temperature mapping; coupling loss; electrode current distribution; finite element method; low-voltage metallized film capacitor geometry; numerical simulation; reactive power; shape optimization; thermal constraint; Capacitors; Current distribution; Electrodes; Geometry; Metallization; Numerical simulation; Optimization methods; Reactive power; Shape; Temperature distribution; Capacitor lifespan; capacitor losses; metallized film capacitors; shape optimization;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2007.892473
  • Filename
    4137826