DocumentCode
753559
Title
Modeling of electrooptic polymer electrical characteristics in a three-layer optical waveguide modulator
Author
Watson, Michael D. ; Ashley, Paul R. ; Guenthner, Andrew J. ; Abushagur, Mustafa A G
Author_Institution
NASA Marshall Space Flight Center, Huntsville, AL, USA
Volume
41
Issue
4
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
589
Lastpage
595
Abstract
The electrical characteristics of electrooptic polymer waveguide modulators are often described by the bulk reactance of the individual layers. However, the resistance and capacitance between the layers can significantly alter the electrical performance of a waveguide modulator. These interface characteristics are related to the boundary charge density and are strongly affected by the adhesion of the layers in the waveguide stack. An electrical reactance model has been derived to investigate this phenomenon at low frequencies. The model shows the waveguide stack frequency response has no limiting effects below the microwave range and that a true dc response requires a stable voltage for over 1000 h. Thus, reactance of the layers is the key characteristic of optimizing the voltage across the core layer, even at very low frequencies (>10-6 Hz). The results of the model are compared with experimental data for two polymer systems and show quite good correlation.
Keywords
capacitance; electric resistance; electro-optical effects; electro-optical modulation; optical multilayers; optical polymers; optical waveguides; boundary charge density; bulk reactance; capacitance; electrical reactance model; electrooptic polymer; layer adhesion; optical waveguide modulator; resistance; Capacitance; Electric resistance; Electric variables; Electrooptic modulators; Electrooptical waveguides; Frequency; Optical modulation; Optical polymers; Optical waveguides; Voltage; Electrooptic polymer; Mach–Zehnder (MZ) modulator; frequency response; waveguide; waveguide layer adhesion; waveguide reactance;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2005.843607
Filename
1411964
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