• DocumentCode
    754769
  • Title

    Test Data Compression Based on Variable-to-Variable Huffman Encoding With Codeword Reusability

  • Author

    Kavousianos, Xrysovalantis ; Kalligeros, Emmanouil ; Nikolos, Dimitris

  • Author_Institution
    Dept. of Comput. Sci., Ioannina Univ., Ioannina
  • Volume
    27
  • Issue
    7
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    1333
  • Lastpage
    1338
  • Abstract
    A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is partitioned into variable-length blocks, which are, then, compressed by an efficient Huffman-based encoding procedure with a limited number of codewords. To increase the compression ratio, the same codeword can be reused for encoding compatible blocks of different sizes. Further compression improvements can be achieved by using two very simple test set transformations. A simple and low-overhead decompression architecture is also proposed.
  • Keywords
    Huffman codes; data compression; codeword reusability; compression ratio; data compression; fixed-to-variable code; low-overhead decompression architecture; multiple scan chains; variable-to-variable Huffman encoding; variable-to-variable code; Circuit testing; Computer architecture; Computer science; Encoding; Hardware; Intellectual property; System testing; System-on-a-chip; Systems engineering and theory; Test data compression; Embedded testing techniques; Huffman encoding; intellectual property (IP) cores; test data compression;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2008.923100
  • Filename
    4544866