• DocumentCode
    755183
  • Title

    Robustness of mean E{X} and R charts

  • Author

    Chan, Lai K. ; Hapuarachchi, K.P. ; Macpherson, B.D.

  • Author_Institution
    Manitoba Univ., Winnipeg, Man., Canada
  • Volume
    37
  • Issue
    1
  • fYear
    1988
  • fDate
    4/1/1988 12:00:00 AM
  • Firstpage
    117
  • Lastpage
    123
  • Abstract
    The effect of nonnormality on E{X} and R charts is reported. The effect of departure from normality can be examined by comparing the probabilities that E{X} and R lie outside their three-standard-deviation and two-standard-deviation control limits. Tukey´s λ-family of symmetric distributions is used because it contains a wide spectrum of distributions with a variety of tail areas. The constants required to construct E{X} and R charts for the λ-family are computed. Control charts based on the assumption of normality give inaccurate results when the tails of the underlying distribution are thin or thick. The validity of the normality assumption is examined by using a numerical example
  • Keywords
    probability; quality control; statistical analysis; R-charts; Tukey lambda-family; X-charts; control charts; nonnormality; probability; robustness; symmetric distributions; Control charts; Frequency; Length measurement; Logistics; Probability distribution; Robust control; Robustness; Sampling methods; Shape; Statistical distributions;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.3728
  • Filename
    3728