DocumentCode
755183
Title
Robustness of mean E {X } and R charts
Author
Chan, Lai K. ; Hapuarachchi, K.P. ; Macpherson, B.D.
Author_Institution
Manitoba Univ., Winnipeg, Man., Canada
Volume
37
Issue
1
fYear
1988
fDate
4/1/1988 12:00:00 AM
Firstpage
117
Lastpage
123
Abstract
The effect of nonnormality on E {X } and R charts is reported. The effect of departure from normality can be examined by comparing the probabilities that E {X } and R lie outside their three-standard-deviation and two-standard-deviation control limits. Tukey´s λ-family of symmetric distributions is used because it contains a wide spectrum of distributions with a variety of tail areas. The constants required to construct E {X } and R charts for the λ-family are computed. Control charts based on the assumption of normality give inaccurate results when the tails of the underlying distribution are thin or thick. The validity of the normality assumption is examined by using a numerical example
Keywords
probability; quality control; statistical analysis; R-charts; Tukey lambda-family; X-charts; control charts; nonnormality; probability; robustness; symmetric distributions; Control charts; Frequency; Length measurement; Logistics; Probability distribution; Robust control; Robustness; Sampling methods; Shape; Statistical distributions;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.3728
Filename
3728
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