Title :
Studying Nanoscale Magnetism and Its Dynamics With Soft X-Ray Microscopy
Author_Institution :
Center for X-ray Opt., E.O. Lawrence Berkeley Nat. Lab., Berkeley, CA
fDate :
7/1/2008 12:00:00 AM
Abstract :
Magnetic soft X-ray microscopy allows for imaging magnetic structures at a spatial resolution down to 15 nm and a time resolution in the sub-100 ps regime. Inherent elemental specificity can be used to image the magnetic response of individual components such as layers in multilayered systems. This review highlights current achievements and discusses the future potential of magnetic soft X-ray microscopy at fsec X-ray sources where snapshot images of ultrafast spin dynamics with a spatial resolution below 10 nm will become feasible.
Keywords :
X-ray microscopy; magnetic multilayers; magnetic structure; magnetisation reversal; nanostructured materials; spin dynamics; Fresnel zone plate optics; femtosecond X-ray sources; inherent elemental specificity; magnetic response; magnetic structures; magnetisation reversal; multilayered systems; nanoscale magnetism; soft X-ray microscopy; ultrafast spin dynamics; Magnetic soft X-ray microscopy; X-ray optics; magnetization reversal; ultrafast spin dynamics;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2008.924532
