Analysis of antireflection coatings using the FD-TD method with the PML absorbing boundary condition

Author

Yamauchi, Junji ; Mita, Makoto ; Aoki, Shin Ichi ; Nakano, Hisamatsu

Author_Institution

Coll. of Eng., Hosei Univ., Tokyo, Japan

Volume

8

Issue

2

fYear

1996

Firstpage

239

Lastpage

241

Abstract

A step-index optical waveguide with an antireflection coating is analyzed using the finite-difference time-domain (FD-TD) method combined with the perfectly matched layer absorbing boundary condition (PML-ABC). It is demonstrated that the numerical simulations having a dynamic range over that for the Mur absorbing boundary condition can be obtained for a single-layer coating. The analysis of a double-layer coating reveals the transient behavior of reflected fields.

Keywords

antireflection coatings; finite difference time-domain analysis; optical films; optical waveguide theory; reflectivity; refractive index; FD-TD method; Mur absorbing boundary condition; PML absorbing boundary condition; antireflection coatings; double-layer coating; dynamic range; finite-difference time-domain method; numerical simulations; perfectly matched layer absorbing boundary condition; reflected field transient behaviour; single-layer coating; step-index optical waveguide; Boundary conditions; Coatings; Dynamic range; Electromagnetic waveguides; Finite difference methods; Optical reflection; Optical waveguides; Perfectly matched layers; Reflectivity; Time domain analysis;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.484253

Filename

484253