DocumentCode
756297
Title
500-MS/s 5-bit ADC in 65-nm CMOS With Split Capacitor Array DAC
Author
Ginsburg, Brian P. ; Chandrakasan, Anantha P.
Author_Institution
Massachusetts Inst. of Technol., Cambridge, MA
Volume
42
Issue
4
fYear
2007
fDate
4/1/2007 12:00:00 AM
Firstpage
739
Lastpage
747
Abstract
A 500-MS/s 5-bit ADC for UWB applications has been fabricated in a 65-nm CMOS technology using no analog-specific processing options. The time-interleaved successive approximation register (SAR) architecture has been chosen due to its simplicity versus flash and its amenability to scaled technologies versus pipelined, which relies on operational amplifiers. Six time-interleaved channels are used, sharing a single clock operating at the composite sampling rate. Each channel has a split capacitor array that reduces switching energy, increases speed, and has similar INL and decreased DNL, as compared to a conventional binary-weighted array. A variable delay line adjusts the instant of latch strobing to reduce preamplifier currents. The ADC achieves Nyquist performance, with an SNDR of 27.8 and 26.1 dB for 3.3and 239 MHz inputs, respectively. The total active area is 0.9mm2, and the ADC consumes 6 mW from a 1.2-V supply
Keywords
CMOS digital integrated circuits; analogue-digital conversion; capacitors; delay lines; nanotechnology; ultra wideband technology; 1.2 V; 239 MHz; 3.3 MHz; 5 bit; 6 mW; 65 nm; CMOS ADC; Nyquist performance; analog-to-digital conversion; deep-submicron CMOS technology; latch strobing; reduced preamplifier currents; scaled technologies; split capacitor array; time-interleaved channels; time-interleaved successive approximation register; ultra-wideband radio; variable delay line; Analog-digital conversion; CMOS process; CMOS technology; Clocks; Energy consumption; Feedback; Operational amplifiers; Sampling methods; Switched capacitor circuits; Throughput; ADC; analog-to-digital conversion; deep-submicron CMOS; successive approximation register; ultra-wideband radio;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2007.892169
Filename
4140585
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