The Quad-Path Hardening Technique for Switched-Capacitor Circuits

Author

Atkinson, N.M. ; Holman, W.T. ; Kauppila, J.S. ; Loveless, T.D. ; Hooten, N.C. ; Witulski, A.F. ; Bhuva, B.L. ; Massengill, Lloyd W. ; En Xia Zhang ; Warner, Jeffrey H.

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA

Volume

60

Issue

6

fYear

2013

fDate

Dec. 2013

Firstpage

4356

Lastpage

4361

Abstract

A novel “quad-path” radiation hardening technique is implemented in a switched-capacitor sample/hold amplifier and validated by laser testing. The proposed technique eliminates the signal-range limitations of the original dual-path hardening technique by using both n- and p-type switches with separate dual and complementary signal paths. Single-event effect sample errors are reduced by up to 90%, with minimal speed, power and area penalties.

Keywords

amplifiers; radiation hardening (electronics); sample and hold circuits; switched capacitor networks; switches; complementary signal paths; laser testing; n-type switches; p-type switches; quad-path radiation hardening technique; sample errors; signal-range limitations; single-event effect; switched-capacitor circuits; switched-capacitor sample-hold amplifier; Radiation hardening (electronics); Single event transients; Switched capacitor circuits; Topology; Transistors; Analog/mixed-signal; analog single-event transients; sample/hold; single-event effects; switched capacitor;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2013.2282312

Filename

6651663