DocumentCode
756704
Title
Multiple image technique (MIT) and anisotropic perfectly matched layer (APML) in implementation of MRTD scheme for boundary truncations of microwave structures
Author
Cao, Qunsheng ; Chen, Yinchao ; Mittra, Raj
Author_Institution
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., China
Volume
50
Issue
6
fYear
2002
fDate
6/1/2002 12:00:00 AM
Firstpage
1578
Lastpage
1589
Abstract
This paper presents an adjustable multiple image technique (MIT) and an anisotropic perfectly matched layer (APML) employed in the context of multiresolution time-domain (MRTD) scheme for the truncation of the computational boundary, with the MIT used for perfect electrically conducting (PEC) shields and the APML for open structures. We begin by presenting a systematic formulation for developing the constitutive relations and update equations in the transform domain of the MRTD, when considering both the original and image regions. We then illustrate the applications of the above techniques by analyzing a two-layer dielectric-loaded cavity, printed circuit enclosed by a PEC, as well as open transmission lines. Although, in principle, one can employ a large number of images to ensure the accuracy of the MRTD computation, in practice, it is useful, from the point-of-view of computational efficiency, to develop a criterion that determines the number of requisite images. While its formulation may appear to be lengthy, the MIT is based on physical concepts that are fairly well suited for computer programming
Keywords
anisotropic media; cavity resonators; dielectric-loaded waveguides; electromagnetic shielding; time-domain analysis; waveguide theory; MRTD scheme; anisotropic perfectly matched layer; boundary truncations; computational boundary; constitutive relations; microwave structures; multiple image technique; multiresolution time-domain scheme; open structures; open transmission lines; perfect electrically conducting shields; transform domain; two-layer dielectric-loaded cavity; update equations; Anisotropic magnetoresistance; Computational efficiency; Dielectrics; Distributed parameter circuits; Equations; Image resolution; Perfectly matched layers; Printed circuits; Time domain analysis; Transforms;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2002.1006420
Filename
1006420
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