• DocumentCode
    757167
  • Title

    Readout ASIC for 3D Position-Sensitive Detectors

  • Author

    Geronimo, Gianluigi De ; Vernon, Emerson ; Ackley, Kim ; Dragone, Angelo ; Fried, Jack ; Connor, Paul O. ; He, Zhong ; Herman, Cedric ; Zhang, Feng

  • Author_Institution
    Instrum. Div., Brookhaven Nat. Lab., Upton, NY
  • Volume
    55
  • Issue
    3
  • fYear
    2008
  • fDate
    6/1/2008 12:00:00 AM
  • Firstpage
    1593
  • Lastpage
    1603
  • Abstract
    We describe an application specific integrated circuit (ASIC) for 3D position-sensitive detectors. It was optimized for pixelated cadmium-zinc-telluride (CZT) sensors, and it measures, corresponding to an ionizing event, the energy and timing of signals from 121 anodes and one cathode. Each channel provides low-noise charge amplification, high-order shaping, along with peak- and timing-detection. The cathode´s timing can be measured in three different ways: the first is based on multiple thresholds on the charge amplifier´s voltage output; the second uses the threshold crossing of a fast-shaped signal; and the third measures the peak amplitude and timing from a bipolar shaper. With its power of 2 mW per channel the ASIC measures, on a CZT sensor connected and biased, charges up to 100 fC with an electronic resolution better than 200 e- rms. Our preliminary spectral measurements applying a simple cathode/anode ratio correction demonstrated a single-pixel resolution of 4.8 keV (0.72 %) at 662 keV, with the electronics and leakage current contributing in total with 2.1 keV.
  • Keywords
    application specific integrated circuits; leakage currents; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 3D position-sensitive detectors; CZT; anode signal timing; application specific integrated circuit; bipolar shaper; cathode signal timing; charge amplifiers voltage output; electron volt energy 2.1 keV; electron volt energy 4.8 keV; electron volt energy 662 keV; electronic resolution; ionizing event; leakage current; low-noise charge amplification; multiple thresholds; peak detection; pixelated cadmium-zinc-telluride sensors; readout ASIC; spectral measurements; timing-detection; Anodes; Application specific integrated circuits; Cathodes; Charge measurement; Current measurement; Energy measurement; Integrated circuit measurements; Position sensitive particle detectors; Shape measurement; Timing; 3D; Application specific integrated circuit (ASIC); Cadmium–Zinc–Telluride (CZT); timing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2008.922217
  • Filename
    4545103