DocumentCode
757208
Title
A Bayes empirical-Bayes model for software reliability
Author
Mazzuchi, Thomas A. ; Soyer, Refik
Author_Institution
George Washington Univ., Washington, DC, USA
Volume
37
Issue
2
fYear
1988
fDate
6/1/1988 12:00:00 AM
Firstpage
248
Lastpage
254
Abstract
The authors present a model for the behavior of software failures. Their model fits into the general framework of empirical Bayes problems; however, they take a proper Bayes approach for inference by viewing the situation as a Bayes empirical-Bayes problem. An approximation due to D.V. Lindley (1980) plays a central role in the analysis. They show that the Littlewood-Verall model (1973) is an empirical Bayes model and discuss a fully Bayes analysis of it using the Bayes empirical-Bayes setup. Finally, they apply both models to some actual software failure data and compare their predictive performance
Keywords
Bayes methods; software reliability; Bayes empirical-Bayes model; Littlewood-Verall model; software failures; software reliability; Error correction; Failure analysis; Probability; Reliability theory; Software measurement; Software performance; Software reliability; Software testing; Statistical analysis; Stochastic processes;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.3749
Filename
3749
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