• DocumentCode
    757208
  • Title

    A Bayes empirical-Bayes model for software reliability

  • Author

    Mazzuchi, Thomas A. ; Soyer, Refik

  • Author_Institution
    George Washington Univ., Washington, DC, USA
  • Volume
    37
  • Issue
    2
  • fYear
    1988
  • fDate
    6/1/1988 12:00:00 AM
  • Firstpage
    248
  • Lastpage
    254
  • Abstract
    The authors present a model for the behavior of software failures. Their model fits into the general framework of empirical Bayes problems; however, they take a proper Bayes approach for inference by viewing the situation as a Bayes empirical-Bayes problem. An approximation due to D.V. Lindley (1980) plays a central role in the analysis. They show that the Littlewood-Verall model (1973) is an empirical Bayes model and discuss a fully Bayes analysis of it using the Bayes empirical-Bayes setup. Finally, they apply both models to some actual software failure data and compare their predictive performance
  • Keywords
    Bayes methods; software reliability; Bayes empirical-Bayes model; Littlewood-Verall model; software failures; software reliability; Error correction; Failure analysis; Probability; Reliability theory; Software measurement; Software performance; Software reliability; Software testing; Statistical analysis; Stochastic processes;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.3749
  • Filename
    3749