DocumentCode :
757339
Title :
Test Program Generation for Communication Peripherals in Processor-Based SoC Devices
Author :
Apostolakis, Andreas ; Gizopoulos, Dimitris ; Psarakis, Mihalis ; Ravotto, Danilo ; Reorda, Matteo Sonza
Author_Institution :
Univ. of Piraeus, Piraeus
Volume :
26
Issue :
2
fYear :
2009
Firstpage :
52
Lastpage :
63
Abstract :
Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.
Keywords :
integrated circuit testing; system-on-chip; communication peripherals; processor-based SoC devices; test program generation; Automatic testing; Built-in self-test; Circuit testing; Costs; Hardware; Manufacturing; Software testing; System testing; System-on-a-chip; Time to market;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2009.43
Filename :
4850411
Link To Document :
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