• DocumentCode
    757339
  • Title

    Test Program Generation for Communication Peripherals in Processor-Based SoC Devices

  • Author

    Apostolakis, Andreas ; Gizopoulos, Dimitris ; Psarakis, Mihalis ; Ravotto, Danilo ; Reorda, Matteo Sonza

  • Author_Institution
    Univ. of Piraeus, Piraeus
  • Volume
    26
  • Issue
    2
  • fYear
    2009
  • Firstpage
    52
  • Lastpage
    63
  • Abstract
    Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.
  • Keywords
    integrated circuit testing; system-on-chip; communication peripherals; processor-based SoC devices; test program generation; Automatic testing; Built-in self-test; Circuit testing; Costs; Hardware; Manufacturing; Software testing; System testing; System-on-a-chip; Time to market;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2009.43
  • Filename
    4850411