DocumentCode
757442
Title
Physics of electron beam ion traps and sources
Author
Currell, Fred ; Fussmann, Gerd
Author_Institution
Dept. of Phys. & Astron., Queen´´s Univ. of Belfast, UK
Volume
33
Issue
6
fYear
2005
Firstpage
1763
Lastpage
1777
Abstract
This paper presents the basic physics underlying the operation of electron beam ion traps and sources, with the machine physics underlying their operation being described in some detail. Predictions arising from this description are compared with some diagnostic measurements.
Keywords
electron beams; ion sources; magnetic traps; plasma sources; plasma-beam interactions; diagnostic measurements; electron beam ion traps; ion sources; machine physics; Electron beams; Electron traps; Ion beams; Ion sources; Ionization; Magnetic confinement; Magnetic fields; Physics; Space charge; Superconducting magnets; Electron beam ion source (EBIS); electron beam ion source/trap (EBIS/T); electron beam ion trap (EBIT); ion source; ion trap;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2005.860072
Filename
1556668
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