DocumentCode :
757891
Title :
A Concept for a Compton Effect Based Dosimeter Calibration System
Author :
Morhaim, C. ; Orion, I. ; Yaar, I.
Author_Institution :
Ben-Gurion Univ. of Negev, Beer-Sheva
Volume :
55
Issue :
3
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1093
Lastpage :
1096
Abstract :
Detectors and dosimeters are used all over the world for monitoring and detection of radiation. As an estimate device for worker´s exposure, a dosimeter must go through a well determined calibration process in a radiation calibration facility, according to international standards. The most common way of calibration is to expose the dosimeter to several mono energy sources, like 241Am or 137Cs, while changing the source to detector distance. In this work, a single mono energy 137Cs source is used to create a wide energy spectrum calibration beam produced by Compton scattering from a copper target. The detector is shifted in a constant radius around the copper target and therefore exposed to energy determined by the angle of the Compton scattered photons. Target geometry optimization was done using the well known MCNP Monte Carlo simulation program and confirmed by experimental measurements. The work done so far, provides a starting point for a commercial dose calibration device based on Compton scattering.
Keywords :
Compton effect; Monte Carlo methods; calibration; dosimetry; optimisation; particle detectors; radiation monitoring; 137Cs sources; 241Am sources; Compton effect; Compton scattering; MCNP; Monte Carlo N-Particle transport code; Monte Carlo simulation program; copper target; dosimeter calibration system; energy spectrum; international standards; optimization; radiation calibration; radiation detection; radiation monitoring; Calibration; Copper; Electromagnetic scattering; Equations; Face detection; Geometry; MONOS devices; Particle scattering; Radiation detectors; Solid modeling; Calibration method; MCNP simulation; compton scattering; radiation detectors;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2008.922834
Filename :
4545169
Link To Document :
بازگشت