Properties of Bragg reflectors composed of isotropic dielectric layers cladded with birefringent media

Author

Ciumac, Mariana ; Mihalache, Dumitru

Author_Institution

Dept. of Theor. Phys., Inst. of Atomic Phys., Bucharest, Romania

Volume

32

Issue

3

fYear

1996

fDate

3/1/1996 12:00:00 AM

Firstpage

513

Lastpage

518

Abstract

The reflectance of an asymmetric periodic dielectric stack comprising a periodic stratified dielectric film bounded by a positive birefringent uniaxial medium on one side and by an isotropic dielectric material on the other side are calculated by using the 4×4 transfer matrix formalism. The results show that the values of the reflectance have a strong dependence on the structure parameters, the incident polarization, and the optical axis orientation. The dependence of the reflectance on the optical axis orientation suggests that this effect could be used for the fabrication of a new kind of Bragg reflector

Keywords

birefringence; claddings; integrated optics; light polarisation; light propagation; mirrors; optical films; reflectivity; transfer function matrices; 4×4 transfer matrix formalism; Bragg reflectors; asymmetric periodic dielectric stack; birefringent media; fabrication; incident polarization; isotropic dielectric layers; isotropic dielectric material; optical axis orientation; periodic stratified dielectric film; positive birefringent uniaxial medium; reflectance; structure parameters; Anisotropic magnetoresistance; Birefringence; Dielectrics; Geometrical optics; Optical bistability; Optical films; Optical superlattices; Optical waveguides; Reflectivity; Transmission line matrix methods;

fLanguage

English

Journal_Title

Quantum Electronics, IEEE Journal of

Publisher

ieee

ISSN

0018-9197

Type

jour

DOI

10.1109/3.485404

Filename

485404