• DocumentCode
    75925
  • Title

    Economizing TSV Resources in 3-D Network-on-Chip Design

  • Author

    Ying Wang ; Yin-He Han ; Lei Zhang ; Bin-Zhang Fu ; Cheng Liu ; Hua-Wei Li ; Xiaowei Li

  • Author_Institution
    SKL Comput. Archit., ICT, Beijing, China
  • Volume
    23
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    493
  • Lastpage
    506
  • Abstract
    The confluence of 3-D integration and network-on-chip (NoC) provides an effective solution to the scalability problem of on-chip interconnects. In 3-D integration, through-silicon via (TSV) is considered to be the most promising bonding technology. However, TSVs are also precious link resources because they consume significant chip area and possibly lead to routing congestion in the physical design stage. In addition, TSVs suffer from serious yield losses that shrink the effective TSV density. Thus, it is necessary to implement a TSV-economical 3-D NoC architecture in cost-effective design. For symmetric 3-D mesh NoCs, we observe that the TSVs bandwidth utilization is low and they rarely become the contention spots in networks as planar links. Based on this observation, we propose the TSV sharing (TS) scheme to save TSVs in 3-D NoC by enabling neighboring routers to share the vertical channels in a time division multiplexing way. We also investigate different TS implementation alternatives and show how TS improves TSV-effectiveness (TE) in multicore processors through a design space exploration. In experiments, we comprehensively evaluate TSs influence on all layers of system. It is shown that the proposed method significantly promotes TE with negligible performance overhead.
  • Keywords
    integrated circuit bonding; integrated circuit design; integrated circuit interconnections; network-on-chip; three-dimensional integrated circuits; time division multiplexing; 3D integration; 3D network-on-chip design; TE; TSV sharing scheme; TSV-economical 3D NoC architecture; TSV-effectiveness; bandwidth utilization; bonding technology; effective TSV resource density; on-chip interconnection; routing congestion; scalability problem; symmetric 3D mesh NoC; through-silicon via; time division multiplexing; vertical channel; yield loss; Bandwidth; Bonding; Routing; Through-silicon vias; Time division multiplexing; Topology; Wiring; 3-D integration; multicore; network-on-chip (NoC); through-silicon via (TSV); through-silicon via (TSV).;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2014.2311835
  • Filename
    6787080