• DocumentCode
    759269
  • Title

    Travelling wave based fault location for teed circuits

  • Author

    Evrenosoglu, Cansín Y. ; Abur, Ali

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    20
  • Issue
    2
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    1115
  • Lastpage
    1121
  • Abstract
    This paper describes a fault location algorithm for three terminal lines using wavelet transform of the fault initiated transients. The results presented in are extended to the case of three terminal configuration and a new single ended procedure is developed for teed circuits. The algorithm gives accurate results for the case of three terminal lines including series compensated branch, mutual coupled line section and different values of fault resistances. The performance of the algorithm is tested on different scenarios by using ATP/EMTP program and MATLAB Wavelet Toolbox.
  • Keywords
    EMTP; coupled circuits; fault location; power transmission faults; wavelet transforms; ATP program; EMTP program; MATLAB wavelet toolbox; electromagnetic transients simulation; fault location algorithm; fault resistance; teed circuits; travelling wave; wavelet transform; Circuit faults; Differential equations; Discrete wavelet transforms; Distributed parameter circuits; Fault location; Mutual coupling; Nonlinear equations; Power transmission lines; Transmission line measurements; Wavelet transforms; Electromagnetic transients simulations; fault location; frequency dependent line model; mutual coupled lines; series compensation; teed circuits; wavelet transform;
  • fLanguage
    English
  • Journal_Title
    Power Delivery, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8977
  • Type

    jour

  • DOI
    10.1109/TPWRD.2004.834303
  • Filename
    1413359