• DocumentCode
    759446
  • Title

    Wavelength references for 1300-nm wavelength-division multiplexing

  • Author

    Dennis, T. ; Curtis, E.A. ; Oates, C.W. ; Hollberg, L. ; Gilbert, S.L.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    20
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    804
  • Lastpage
    810
  • Abstract
    We have conducted a study of potential wavelength calibration references for use as both moderate-accuracy transfer standards and high-accuracy National Institute of Standards and Technology (NIST) internal references in the 1280-1320-nm wavelength-division-multiplexing region. We found that most atomic and molecular absorption lines in this region are not ideal for use as wavelength references owing to factors such as weak absorption, complex spectra, or special requirements (for example, frequency-doubling or excitation with an additional light or discharge source). We have demonstrated one of the simpler schemes consisting of a tunable diode laser stabilized to a Doppler-broadened methane absorption line. By conducting a beat-note comparison of this reference to a calcium-based optical frequency standard, we measured the methane line center with an expanded uncertainty (2σ) of ±2.3 MHz. This methane-stabilized laser now serves as a NIST internal reference.
  • Keywords
    Doppler broadening; absorbing media; calibration; frequency standards; semiconductor lasers; transfer standards; wavelength division multiplexing; 1300 nm; Doppler-broadened methane absorption line; absorbing media; beat-note comparison; expanded uncertainty; high-accuracy internal references; methane-stabilized laser; moderate-accuracy transfer standards; optical fiber communication; optical frequency standard; semiconductor lasers; tunable diode laser; wavelength calibration references; wavelength-division-multiplexing; Absorption; Calibration; Diode lasers; Fault location; Frequency; Laser excitation; Measurement standards; NIST; Tunable circuits and devices; Wavelength division multiplexing;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2002.1007933
  • Filename
    1007933