• DocumentCode
    759447
  • Title

    Response of GaAs displacement damage monitors to protons, electrons, and gamma radiation

  • Author

    Barry, Albert L. ; Wojcik, Richard ; MacDiarmid, Andrew L.

  • Author_Institution
    Commun. Res. Centre, Ottawa, Ont., Canada
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    2400
  • Lastpage
    2404
  • Abstract
    The need to characterize the radiation hardness of certain classes of devices in terms of atomic displacement damage rather than total absorbed dose is addressed. Resistive-network displacement damage monitors irradiated with 1.0-MeV protons and 7.3-MeV electrons indicate that these radiations are both about twenty times as damaging as 60 Co gamma radiation for the same total absorbed dose. Preliminary results are presented on an alternative monitor consisting of a GaAs LED (light-emitting diode) that offers a two-order-of-magnitude increase in sensitivity over the resistive network monitors. Other characteristics of the two monitors, such as range, linearity, annealing and reuse, and neutron sensitivity, are compared
  • Keywords
    III-V semiconductors; dosimeters; electron beam effects; environmental testing; gallium arsenide; gamma-ray effects; light emitting diodes; proton effects; radiation hardening (electronics); radiation monitoring; resistors; semiconductor technology; 1 MeV; 7.3 MeV; 60Co gamma radiation; GaAs LED; GaAs displacement damage monitors; annealing; atomic displacement damage; characteristics; electrons; gamma radiation; increase in sensitivity; light-emitting diode; linearity; neutron sensitivity; protons; radiation hardness; range; resistive network monitors; reuse; semiconductors; total absorbed dose; Atomic measurements; Character recognition; Degradation; Electrons; Gallium arsenide; Gamma rays; Insulation; Protons; Semiconductor device measurement; Testing;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.45454
  • Filename
    45454