DocumentCode
759754
Title
Novel VCO Architecture Using Series Above-IC FBAR and Parallel LC Resonance
Author
Ostman, Kim B. ; Sipila, Sami T. ; Uzunov, Ivan S. ; Tchamov, Nikolay T.
Author_Institution
Inst. of Commun. Eng., Tampere Univ. of Technol.
Volume
41
Issue
10
fYear
2006
Firstpage
2248
Lastpage
2256
Abstract
A quasi-monolithic voltage-tunable film bulk acoustic resonator (FBAR) enhanced oscillator for 2.1 GHz in 0.25-mum SiGe BiCMOS technology is designed, fabricated, and evaluated. The narrow-band FBAR was built above the SiGe circuit through later Si post-processing steps. The oscillator is based on a two-transistor loop structure and uses two resonators, namely a parallel LC tank and an above-IC FBAR in its series-resonant mode. The improvement in phase noise performance is significant compared to a similar reference LC voltage-controlled oscillator (VCO), with the best phase noise being -144.1 dBc/Hz at an offset of 1 MHz and -149.6 dBc/Hz at 3 MHz. The architecture offers advantages in overcoming frequency tuning difficulties usually present when using high-Q resonators. Although the width of the tuning range comes at some cost on phase noise, the measured performance satisfies contemporary wireless standards such as GPS
Keywords
BiCMOS integrated circuits; Ge-Si alloys; UHF oscillators; acoustic resonators; integrated circuit noise; phase noise; voltage-controlled oscillators; 0.25 micron; 2.1 GHz; BiCMOS technology; SiGe; VCO architecture; above-IC FBAR; parallel LC resonance; parallel LC tank; phase noise; quasimonolithic voltage-tunable film bulk acoustic resonator; series-resonant mode; two-transistor loop structure; voltage controlled oscillator; BiCMOS integrated circuits; Film bulk acoustic resonators; Frequency; Germanium silicon alloys; Narrowband; Phase noise; Resonance; Silicon germanium; Tuning; Voltage-controlled oscillators; Film bulk acoustic resonator (FBAR) voltage-controlled oscillator (VCO); integrated circuits; phase noise; piezoelectric resonator oscillators; tuning range;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2006.881567
Filename
1703679
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