• DocumentCode
    76001
  • Title

    Research on Voltage and Current Transient Process of Foilless Diode for RBWO

  • Author

    Shaofei Huo ; Changhua Chen ; Jun Sun ; Zhimin Song ; Renzhen Xiao ; Wei Song ; Yan Teng

  • Author_Institution
    Northwest Inst. of Nucl. Technol., Xi´an, China
  • Volume
    41
  • Issue
    10
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    2763
  • Lastpage
    2768
  • Abstract
    As the impedance of the foilless diode for a relativistic backward wave oscillator and the transmission line of the high-current accelerator are mismatching, a method is brought forward to study the voltage and current transient process of the foilless diode by analyzing the voltage and current wave reflection and superposition. In addition, by theoretical analysis, particle-in-cell numerical simulations and experiment based on the SINUS-881 accelerator, the effects of periodic oscillations of growth rate in the high-voltage pulse´s rising edge applying to the diode from the Tesla-type accelerator and the time when the cathode begins to emit on transient process are discussed. In addition, the characteristics of rising edges of voltage and current are meticulously discerned.
  • Keywords
    backward wave oscillators; cathodes; diodes; microwave generation; numerical analysis; transients; transmission lines; RBWO; SINUS-881 accelerator; Tesla-type accelerator; cathode; current transient process; current wave reflection; foilless diode impedance; high-current accelerator; high-voltage pulse rising edge; particle-in-cell numerical simulations; periodic oscillations; relativistic backward wave oscillator; rising edges; superposition; transmission line; voltage transient process; voltage wave reflection; Cathodes; Current measurement; Impedance; Oscillators; Transient analysis; Voltage measurement; Foilless diode; high-power microwave; transient process; voltage and current;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2013.2274736
  • Filename
    6576210