Title :
Transfer-matrix analysis of the intensity and phase noise of multisection DFB semiconductor lasers
Author :
Makino, Toshihiko
Author_Institution :
Bell-Northern Res. Ltd., Ottawa, Ont., Canada
fDate :
11/1/1991 12:00:00 AM
Abstract :
A general small-signal model for the intensity and phase noise spectra of multisection distributed feedback (DFB) semiconductor lasers is developed by using the transfer-matrix approach based on the Green´s function method. The spontaneous emission enhancements due to nonuniform longitudinal field distribution and the effective amplitude-phase coupling effect (the effective linewidth enhancement factor) are taken into account in the formulation. Analytical expressions for the spectra of the relative intensity noise and the FM noise of the main mode in the multimode operation are presented by using the transfer functions in a flow-graph representation. Facet reflectivities and external optical feedback are included in the model. The effects of the grating coupling coefficient, the random grating-phase at the facets, the phase-shift position, the external optical feedback, and the side mode on the noise spectra are analyzed systematically for a λ/4-shifted DFB laser
Keywords :
Green´s function methods; distributed feedback lasers; electron device noise; laser theory; semiconductor junction lasers; FM noise; Green´s function method; distributed feedback; effective amplitude-phase coupling effect; effective linewidth enhancement factor; external optical feedback; facet reflectivities; flow-graph representation; grating coupling coefficient; intensity noise; multimode operation; multisection DFB semiconductor lasers; noise spectra; nonuniform longitudinal field distribution; phase noise; phase-shift position; random grating-phase; side mode; small-signal model; spontaneous emission enhancements; transfer functions; transfer-matrix approach; Distributed feedback devices; Gratings; Laser feedback; Laser modes; Laser noise; Optical feedback; Optical noise; Phase noise; Semiconductor device noise; Semiconductor lasers;
Journal_Title :
Quantum Electronics, IEEE Journal of