DocumentCode
760933
Title
A silicon-based integrated NMOS-p-i-n photoreceiver
Author
Garrett, L.D. ; Qi, J. ; Schow, C.L. ; Campbell, J.C.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume
43
Issue
3
fYear
1996
fDate
3/1/1996 12:00:00 AM
Firstpage
411
Lastpage
416
Abstract
For large-volume optoelectronics applications, the low cost, manufacturability and reliability of silicon MOSFET technology are advantageous. In addition, silicon photodetectors operate quite efficiently at the 850 nm wavelength of economical AlGaAs light sources. In this paper, we report on a silicon-based monolithic optical receiver. The fabrication of the integrated lightwave receiver was carried out on a nominally undoped p-type Si substrate. The p-i-n photodetector was fabricated directly on the high-resistivity substrate so that the thickness of the detector depletion layer was approximately equal to the optical absorption length of 850 nm light in silicon. A more heavily-doped p-well was formed for the NMOSFET fabrication. The silicon photodiodes had a dark current of 20 nA at 5 V, a breakdown voltage greater than 60 V, and a zero-bias capacitance of 40 fF. The external quantum efficiency of the photodiode at 870 nm was approximately 67% at 5 V without an AR coating, and the bandwidth of the device was approximately 1.3 GHz. Frequency response evaluation of the receiver indicated a circuit-design-limited bandwidth of 30 MHz with open eye diagrams demonstrated at 40 MB/s
Keywords
elemental semiconductors; integrated optoelectronics; light absorption; optical receivers; p-i-n photodiodes; phototransistors; silicon; 1.3 GHz; 20 nA; 40 fF; 5 V; 67 percent; 850 nm; MOSFET technology; NMOS-p-i-n photoreceiver; Si; breakdown voltage; circuit-design-limited bandwidth; dark current; detector depletion layer; external quantum efficiency; frequency response evaluation; high-resistivity substrate; integrated lightwave receiver; large-volume optoelectronics applications; monolithic optical receiver; open eye diagrams; optical absorption length; zero-bias capacitance; Bandwidth; Costs; Light sources; MOSFET circuits; Manufacturing; Optical device fabrication; Optical receivers; Photodetectors; Photodiodes; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.485654
Filename
485654
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