• DocumentCode
    761336
  • Title

    Real-time and high-speed measurements of charging processes on dielectric surface in vacuum

  • Author

    Suzuki, Kiyoteru ; Kato, Katsumi ; Hakamata, Yoshimi ; Okubo, Hitoshi

  • Author_Institution
    Dept. of Electr. Eng., Nagoya Univ., Japan
  • Volume
    10
  • Issue
    4
  • fYear
    2003
  • Firstpage
    563
  • Lastpage
    568
  • Abstract
    In order to investigate the charging mechanisms of solid dielectrics in vacuum, we constructed real-time and high-speed measurement systems for charge density, current pulse, light emission and applied voltage. By applying a negative DC ramped voltage to an electrode with a cathode triple-junction (TJ), we measured the temporal variation of surface charge accumulation and current pulse waveforms expressing the electron emission from TJ, by electrostatic probes. From the measurement results, we explain the step like charging process and propose an electron emission model by taking the electric field and its relaxation by charging into account. In addition, we elucidate the relationship between the charging process and the location of electron emission.
  • Keywords
    charge measurement; electric current measurement; electric fields; electron emission; flashover; insulation; surface charging; surface potential; voltage measurement; applied voltage; cathode triple-junction; charge density; charging mechanisms; current pulse; dielectric surface; electric field relaxation; electrode; electron emission model; electrostatic probes; high-speed measurement systems; light emission; negative DC ramped voltage; real-time measurement systems; solid dielectrics; step like charging process; surface charge accumulation; vacuum; Charge measurement; Current measurement; Dielectric measurements; Electron emission; Electrostatic measurements; Pulse measurements; Solids; Surface charging; Vacuum systems; Voltage;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2003.1219638
  • Filename
    1219638