Compact-scan, plane-polar microwave holographic technique for reflector antenna profile measurement

The simulation and practical results of a short range microwave holographic technique for the measurement of reflector antenna surface profile are presented. The technique uses a linearly scanned transmit/receive CW probe located on-axis at approximately two focal lengths from the reflector vertex. A compact plane polar data set is obtained and used to reconstruct the surface profile error map. A comparison is made between the microwave measurement technique and a more traditional mechanical measurement of the reflector surface. It is shown that synthetic aperture holographic principles can be employed in a non-anechoic environment. The method is aimed primarily at reflectors up to 5 m in diameter, but with suitable scanning systems it can be applied equally well to larger antennas