DocumentCode
762483
Title
Droplet charge-to-mass ratio measurement in an EHD liquid-liquid extraction system
Author
He, Wuhai ; Chang, Jen-Shih ; Baird, Malcolm H I
Author_Institution
Dept. of Mech. Eng., Toronto Univ., Ont., Canada
Volume
32
Issue
1
fYear
1996
Firstpage
146
Lastpage
154
Abstract
The application of a high voltage electric field to enhance the rate of mass transfer in liquid-liquid extraction has been an active subject of investigation in recent years. The electrohydrodynamic (EHD) forces generated by electric fields at a liquid-liquid interface have a potential application in chemical processing industry solvent extraction processes. In this work, the charge-to-mass ratio of droplets formed in an EHD liquid-liquid extraction system has been investigated experimentally and theoretically. The results reported from the present investigation, extending from the single discrete droplet regime (at low applied voltages) to the dispersed multi-droplet regime (at high applied voltages), indicate that the modified Rayleigh instability model and Vonnegut and Neubauer model can explain maximum droplet charge acquired in liquid-liquid systems, especially the modified Vonnegut and Neubauer model which can predict most of the experimental results when the applied electric field is high enough and EHD forces become dominant
Keywords
charge measurement; chemical industry; drops; electric charge; electric field effects; electrohydrodynamics; mass measurement; mass transfer; Neubauer model; Vonnegut model; applied electric field; chemical processing industry; dispersed multi-droplet regime; droplet charge-to-mass ratio measurement; electrohydrodynamic forces; liquid-liquid extraction system; modified Rayleigh instability model; single discrete droplet regime; solvent extraction processes; Chemical industry; Chemical processes; Current measurement; Dielectric constant; Dielectric measurements; Helium; Industry Applications Society; Predictive models; Solvents; Voltage;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/28.485826
Filename
485826
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