• DocumentCode
    763250
  • Title

    Estimation of FMAX and ISB in microprocessors

  • Author

    Abulafia, Yossi ; Kornfeld, Avner

  • Author_Institution
    Intel Corp., Haifa, Israel
  • Volume
    13
  • Issue
    10
  • fYear
    2005
  • Firstpage
    1205
  • Lastpage
    1209
  • Abstract
    Inherent process device variations and fluctuations during manufacturing have a large impact on the microprocessor maximum clock frequency and total leakage power. These fluctuations have a statistical distribution that calls for usage of statistical methods for frequency and leakage analysis. This paper presents a simple technique for accurate estimation of product high-level (Full Chip) parameters such as the maximum frequency (FMAX) distribution and the total leakage (ISB). Moreover, this technique can grade critical paths by their failure probability and perform what-if analysis to estimate FMAX after fixing specific speed paths. Using our FMAX/ISB prediction, we show good correlation with silicon measurements from a production microprocessor.
  • Keywords
    Monte Carlo methods; integrated circuit reliability; leakage currents; microprocessor chips; network analysis; statistical analysis; FMAX estimation; ISB estimation; critical path analysis; failure probability; frequency analysis; full chip parameters; high-level parameters; leakage analysis; maximum clock frequency; maximum frequency distribution; microprocessors; total leakage power; Clocks; Failure analysis; Fluctuations; Frequency estimation; Manufacturing processes; Microprocessors; Performance analysis; Probability; Statistical analysis; Statistical distributions; Critical path delay; FMAX distribution; die-to-die process variation; path-to-path correlation; spatial timing model (STM); static timing analysis (STA); statistical static timing analysis (SSTA); subthreshold leakage (ISB); systematic process variation; timing model (TM); within-die process fluctuation;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2005.859469
  • Filename
    1561250