Title :
Device for Measuring the Thermal Cycling Degradation in 2G Tapes for Electrical Power Applications
Author :
Ceballos, Jose Maria ; Alvarez, Alfredo ; Suarez, Pilar ; Amaro, Nuno ; Perez, Belen
Author_Institution :
Benito Mahedero Group of Electr. Applic. of Supercond., Univ. of Extremadura, Badajoz, Spain
Abstract :
The standard electrical engineering applications of high-temperature superconductors (HTSs) as coils (SMESs), motors, power cables, fault current limiters (SFCLs), etc., usually involve operating conditions under which the critical current of HTS tapes might be degraded. The dependence of such magnitude on mechanical properties, frequency variations, or thermal changes is a key concern for the accurate design of those devices. Two of the parameters affecting the critical current when the superconductor operates in broad temperature ranges are the number and the speed of transitions from the superconducting to the normal state. In order to determine how these parameters affect the critical current, we have designed an automated dipping setup in liquid nitrogen to reproduce heating and cooling cycles on superconducting tapes. In this paper, this device is described, and several tests on a short sample of YBCO coated conductor are reported and analyzed.
Keywords :
barium compounds; critical currents; high-temperature superconductors; power cables; superconducting cables; superconducting fault current limiters; superconducting tapes; thermal variables measurement; yttrium compounds; 2G tapes; HTS tapes; YBCO; YBCO coated conductor; automated dipping setup; coils; cooling cycles; critical current; electrical power applications; fault current limiters; frequency variations; heating cycles; high-temperature superconductors; liquid nitrogen; mechanical properties; power cables; standard electrical engineering applications; thermal changes; thermal cycling degradation measurement; Critical current density (superconductivity); Degradation; Heating; Nitrogen; Superconducting films; Superconducting magnetic energy storage; Yttrium barium copper oxide; Critical current degradation; YBCO tape; critical current degradation; thermal cycles;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2014.2377474