• DocumentCode
    763331
  • Title

    Development of micromechanical testing machine and its application

  • Author

    Park, Jun-Hyub

  • Author_Institution
    MEMS Lab., Samsung Adv. Inst. of Technol., Kyongki, South Korea
  • Volume
    25
  • Issue
    2
  • fYear
    2002
  • fDate
    6/1/2002 12:00:00 AM
  • Firstpage
    317
  • Lastpage
    322
  • Abstract
    In this study, a small-sized DC motor type axial mechanical testing machine was developed to be utilized for fatigue testing of electronic parts such as ICs, etc. Thermal fatigue cracking in a beam lead in μBGA, a type of chip scale package (CSP), was identified as a major failure mode in the quality assurance test or in the field. The beam lead was made with copper foil. Thus, the reliability of the μBGA was strongly dependent on the fatigue characteristics of the copper used. In this study, the four kinds of beam leads made by different processes, were tested to obtain the tensile strength and fatigue characteristics and compared them with each other. The tensile and fatigue strength of the beam lead fabricated by a chemical polishing process with dipping time of 50 min is the best among the beam leads tested. The result of this study enables us to estimate the reliability of the μBGA without the temperature cycling test of a fully assembled μBGA
  • Keywords
    ball grid arrays; beam-lead devices; chip scale packaging; copper; fatigue cracks; fatigue testing; integrated circuit reliability; integrated circuit testing; mechanical testing; tensile strength; test equipment; thermal stress cracking; μBGA; CSP; Cu; Cu foil; DC motor type mechanical testing machine; IC testing; beam lead testing; chip scale package; creep test; electronic parts; fatigue characteristics; fatigue strength; fatigue testing; micro-BGA; micromechanical testing machine; quality assurance test; reliability estimation; static test; tensile strength; thermal fatigue crack; Chemical processes; Chip scale packaging; Copper; DC motors; Electronic equipment testing; Electronic packaging thermal management; Fatigue; Micromechanical devices; Packaging machines; Quality assurance;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2002.1010023
  • Filename
    1010023