• DocumentCode
    763349
  • Title

    Chemistry is right for T-ray imaging

  • Author

    Nuss, Martin C.

  • Author_Institution
    AT&T Bell Labs., Holmdel, NJ, USA
  • Volume
    12
  • Issue
    2
  • fYear
    1996
  • fDate
    3/1/1996 12:00:00 AM
  • Firstpage
    25
  • Lastpage
    30
  • Abstract
    What do you get if you combine very high frequency microwaves, real-time imaging, submillimeter spatial resolution, and chemical sensitivity? The answer is Terahertz, or “T”-ray, imaging. This novel imaging technology operates in the submillimeterwave region of the electro-magnetic spectrum, a portion of the spectrum that was previously hard to access using conventional technologies. But recent advances in high-speed optoelectronic and femtosecond laser technology facilitate generation and detection of short bursts of terahertz radiation, which have proven to be extremely useful for spectroscopic measurements in the submillimeter-wave range. T-ray imaging combines these spectroscopic measurements with real-time imaging and advanced signal processing and recognition, so that each pixel element of the image contains spectroscopic information about the object. In many cases, the spectroscopic information gives us significant clues about the chemical composition of the object of interest
  • Keywords
    measurement by laser beam; spectrochemical analysis; submillimetre wave imaging; submillimetre wave lasers; submillimetre wave spectroscopy; T-ray imaging; chemical composition; chemical sensitivity; femtosecond laser technology; pixel element; real-time imaging; spectroscopic measurements; submillimeter spatial resolution; submillimeterwave region; terahertz imaging; Chemical technology; Chemistry; Frequency; High-resolution imaging; Microwave imaging; Optical imaging; Spatial resolution; Spectroscopy; Submillimeter wave measurements; Submillimeter wave technology;
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/101.485909
  • Filename
    485909