DocumentCode :
763580
Title :
A novel technique to measure the dynamic response of an optical phase modulator
Author :
Levesque, Marc ; Têtu, Michel ; Tremblay, Pierre ; Chamberland, Martin
Author_Institution :
Dept. de Genie Electr., Laval Univ., Que., Canada
Volume :
44
Issue :
5
fYear :
1995
fDate :
10/1/1995 12:00:00 AM
Firstpage :
952
Lastpage :
957
Abstract :
This paper describes a novel technique that can be used to measure the frequency response of an optical phase modulator. An interesting feature of this technique is that it does not require the use of an interferometer for phase-to-amplitude conversion, thus alleviating stability and alignment problems. Instead, the electro-optically induced birefringence of the modulator and a simple polarizer are used to transform phase modulation into intensity modulation. The latter is detected with a high-speed photodiode and, for a sinusoidal modulating signal, the resulting output power spectrum is shown to be related to the actual phase modulation index by simple mathematical expressions involving Bessel functions. Using only a spectrum analyzer, the magnitude and the variations of the modulation index are measured over a broad frequency range
Keywords :
Bessel functions; birefringence; dynamic response; electro-optical modulation; frequency response; frequency-domain analysis; lithium compounds; optical variables measurement; phase modulation; photodiodes; polarimetry; spectral analysers; Bessel functions; LiNbO3; LiNbO3 waveguide phase modulator; dynamic response measurement; electro-optically induced birefringence; frequency response measurement; high-speed photodiode; intensity modulation; optical phase modulator; output power spectrum; phase modulation index; phase modulation transformation; polarizer; sinusoidal modulating signal; spectrum analyzer; Birefringence; Frequency measurement; Frequency response; High speed optical techniques; Intensity modulation; Optical interferometry; Optical modulation; Phase measurement; Phase modulation; Stability;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.414506
Filename :
414506
Link To Document :
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