• DocumentCode
    763974
  • Title

    Modeling and maximizing burn-in effectiveness

  • Author

    Chien, Wei-Ting Kary ; Kuo, Way

  • Author_Institution
    Dept. of Ind. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    44
  • Issue
    1
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    19
  • Lastpage
    25
  • Abstract
    System burn-in can get rid of many residual defects left from component and subsystem burn-in since incompatibility exists not only among components but also among different subsystems and at the system level. Even if system, subsystem, and component burn-in are performed, the system reliability often does not achieve the requirement. In this case, redundancy is a good way to increase system reliability when improving component reliability is expensive. This paper proposes a nonlinear model to: estimate the optimal burn-in times for all levels, and determine the optimal amount of redundancy for each subsystem. For illustration, a bridge system configuration is considered; however, the model can be easily applied to other system configurations. Since there are few studies on system, subsystem, and component incompatibility, reasonable values are assigned for the compatibility factors at each level
  • Keywords
    bridge circuits; electronic equipment manufacture; optimisation; redundancy; reliability; bridge system; burn-in effectiveness maximisation; burn-in effectiveness modelling; nonlinear model; optimal burn-in times estimation; redundancy; system reliability; Costs; Failure analysis; Independent component analysis; Integrated circuit modeling; Reliability; Shape; Steady-state; Stress; Tellurium; Temperature distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.376515
  • Filename
    376515