DocumentCode
765162
Title
Disturb Robust Switching Astroid Curve of C-Shape Cell With Weakly Coupled Synthetic Antiferromagnetic Layer
Author
Nakayama, Masahiko ; Kai, Tadashi ; Ikegawa, Sumio ; Yoda, Hiroaki ; Kishi, Tatsuya ; Kitagawa, Eiji ; Nagase, Toshihiko ; Yoshikawa, Masatoshi ; Asao, Yoshiaki ; Tsuchida, Kenji
Author_Institution
Corp. Res. Dev. Center, Toshiba Corp., Kawasaki
Volume
42
Issue
10
fYear
2006
Firstpage
2733
Lastpage
2735
Abstract
Switching astroid curve of "C-shape" cell with weakly coupled synthetic antiferomagnetic layer is studied. Micromagnetic model simulation and experimental measurements clearly show that the switching mechanism of this magnetic element strongly depends on the C-type magnetic domain, derived from characteristic shape anisotropy, and strength of interlayer exchange coupling. In particular, weak interlayer exchange coupling changes the switching fields when the large field is applied on hard axis. The obtained astroid curve improves not only the disturbance problems of magnetoresistive random access memory (MRAM) with the easy axis field but also that with the hard axis field
Keywords
antiferromagnetism; magnetic anisotropy; magnetic domains; magnetic switching; magnetic tunnelling; magnetic tunnel junction; magnetoresistive random access memory; micromagnetic model simulation; robust switching astroid curve; switching fields; switching mechanism; synthetic antiferromagnetic layer; weak interlayer exchange coupling; Antiferromagnetic materials; Extraterrestrial measurements; Magnetic anisotropy; Magnetic domains; Magnetic field measurement; Magnetic switching; Micromagnetics; Perpendicular magnetic anisotropy; Robustness; Shape measurement; Magnetic tunnel junction (MTJ); magnetoresistive random access memory (MRAM); switching astroid curve; synthetic antiferromagnetic layer;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2006.878854
Filename
1704421
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