• DocumentCode
    765162
  • Title

    Disturb Robust Switching Astroid Curve of C-Shape Cell With Weakly Coupled Synthetic Antiferromagnetic Layer

  • Author

    Nakayama, Masahiko ; Kai, Tadashi ; Ikegawa, Sumio ; Yoda, Hiroaki ; Kishi, Tatsuya ; Kitagawa, Eiji ; Nagase, Toshihiko ; Yoshikawa, Masatoshi ; Asao, Yoshiaki ; Tsuchida, Kenji

  • Author_Institution
    Corp. Res. Dev. Center, Toshiba Corp., Kawasaki
  • Volume
    42
  • Issue
    10
  • fYear
    2006
  • Firstpage
    2733
  • Lastpage
    2735
  • Abstract
    Switching astroid curve of "C-shape" cell with weakly coupled synthetic antiferomagnetic layer is studied. Micromagnetic model simulation and experimental measurements clearly show that the switching mechanism of this magnetic element strongly depends on the C-type magnetic domain, derived from characteristic shape anisotropy, and strength of interlayer exchange coupling. In particular, weak interlayer exchange coupling changes the switching fields when the large field is applied on hard axis. The obtained astroid curve improves not only the disturbance problems of magnetoresistive random access memory (MRAM) with the easy axis field but also that with the hard axis field
  • Keywords
    antiferromagnetism; magnetic anisotropy; magnetic domains; magnetic switching; magnetic tunnelling; magnetic tunnel junction; magnetoresistive random access memory; micromagnetic model simulation; robust switching astroid curve; switching fields; switching mechanism; synthetic antiferromagnetic layer; weak interlayer exchange coupling; Antiferromagnetic materials; Extraterrestrial measurements; Magnetic anisotropy; Magnetic domains; Magnetic field measurement; Magnetic switching; Micromagnetics; Perpendicular magnetic anisotropy; Robustness; Shape measurement; Magnetic tunnel junction (MTJ); magnetoresistive random access memory (MRAM); switching astroid curve; synthetic antiferromagnetic layer;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2006.878854
  • Filename
    1704421