DocumentCode
765184
Title
Design, fabrication, and characterization of deep-etched waveguide gratings
Author
Kleckner, Todd C. ; Modotto, Daniele ; Locatelli, Andrea ; Mondia, Jessica P. ; Linden, Stefan ; Morandotti, Roberto ; De Angelis, Costantino ; Stanley, Colin R. ; Van Driel, Henry M. ; Aitchison, J.Stewart
Author_Institution
Dept. of Electron. & Electr. Eng., Univ. of Glasgow, UK
Volume
23
Issue
11
fYear
2005
Firstpage
3832
Lastpage
3842
Abstract
One-dimensional (1-D) deep-etched gratings on a specially grown AlGaAs wafer were designed and fabricated. The gratings were fabricated using state-of-the-art electron beam lithography and high-aspect-ratio reactive ion etching (RIE) in order to achieve the required narrow deep air slots with good accuracy and reproducibility. Since remarkable etch depths (up to 1.5 μm), which completely cut through the waveguide core layer, have been attained, gratings composed of only five periods (and, thus, shorter than 6 μm) have a bandgap larger than 100 nm. A defect was introduced by increasing the width of the central semiconductor tooth to create microcavities that exhibit a narrow transmission peak (less than 7 nm) around the wavelength of 1530 nm. The transmission spectra between 1460 and 1580 nm have been systematically measured, and the losses have been estimated for a set of gratings, both with and without a defect, for different periods and air slot dimensions. Numerical results obtained via a bidirectional beam propagation code allowed the evaluation of transmissivity, reflectivity, and diffraction losses. By comparing experimental results with the authors´ numerical findings, a clear picture of the role of the grating´s geometric parameters in determining its spectral features and diffractive losses is illustrated.
Keywords
diffraction gratings; electron beam lithography; microcavities; optical design techniques; optical fabrication; optical losses; optical waveguides; reflectivity; sputter etching; 1460 to 1580 nm; AlGaAs; AlGaAs wafer; bidirectional beam propagation code; deep etching; design; diffraction losses; electron beam lithography; fabrication; microcavities; reactive ion etching; reflectivity; transmission spectra; transmissivity; waveguide gratings; Diffraction; Electron beams; Etching; Gratings; Lithography; Optical device fabrication; Photonic band gap; Propagation losses; Reproducibility of results; Semiconductor waveguides; Defect waveguides; diffraction; gratings; photonic crystals; reflection; semiconductor waveguides;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2005.857737
Filename
1561415
Link To Document