Title :
Measurement systems for the investigation of soldering quality in high-power diode laser bars
Author :
Troger, J. ; Schwarz, M. ; Jakubowicz, A.
Author_Institution :
Bookham (Switzerland) AG, Zurich, Switzerland
Abstract :
Thermal and spatial-spectral imaging methods are used to investigate the soldering quality in high-power laser-bar devices. The temperature distribution and the wavelength profile across a driven laser bar correlate with the local thermal resistance between laser and cooler and, thus, with the uniformity of the solder layers. Measurements with a properly soldered and a deficiently soldered laser bar are made for the illustration and comparison of the methods.
Keywords :
infrared imaging; semiconductor device measurement; semiconductor lasers; soldering; temperature distribution; thermal resistance; diode laser bars; soldering; spatial-spectral imaging; temperature distribution; thermal imaging; thermal resistance; Bars; Diode lasers; Optical imaging; Optical microscopy; Pump lasers; Semiconductor laser arrays; Soldering; Temperature distribution; Thermal resistance; Wavelength measurement; Gratings; imaging; photothermal effects; semiconductor laser arrays; soldering;
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2005.857757