• DocumentCode
    765254
  • Title

    Measurement systems for the investigation of soldering quality in high-power diode laser bars

  • Author

    Troger, J. ; Schwarz, M. ; Jakubowicz, A.

  • Author_Institution
    Bookham (Switzerland) AG, Zurich, Switzerland
  • Volume
    23
  • Issue
    11
  • fYear
    2005
  • Firstpage
    3889
  • Lastpage
    3892
  • Abstract
    Thermal and spatial-spectral imaging methods are used to investigate the soldering quality in high-power laser-bar devices. The temperature distribution and the wavelength profile across a driven laser bar correlate with the local thermal resistance between laser and cooler and, thus, with the uniformity of the solder layers. Measurements with a properly soldered and a deficiently soldered laser bar are made for the illustration and comparison of the methods.
  • Keywords
    infrared imaging; semiconductor device measurement; semiconductor lasers; soldering; temperature distribution; thermal resistance; diode laser bars; soldering; spatial-spectral imaging; temperature distribution; thermal imaging; thermal resistance; Bars; Diode lasers; Optical imaging; Optical microscopy; Pump lasers; Semiconductor laser arrays; Soldering; Temperature distribution; Thermal resistance; Wavelength measurement; Gratings; imaging; photothermal effects; semiconductor laser arrays; soldering;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2005.857757
  • Filename
    1561421