Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)

Author

Koblischka-Veneva, A. ; Koblischka, M.R. ; Mücklich, F. ; Murphy, S. ; Zhou, Y. ; Shvets, I.V.

Author_Institution

Inst. of Functional Mater., Saarbrucken Univ.

Volume

42

Issue

10

fYear

2006

Firstpage

2873

Lastpage

2875

Abstract

The crystallographic orientation of magnetite (Fe₃O₄) thin films was measured using electron backscatter diffraction (EBSD). Misorientation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250degC. Most small-angle misorientations (<5deg) are removed after one minute of annealing, whereas larger misorientations (as high as 60deg) continue to persist

Keywords

crystal orientation; electron backscattering; electron diffraction; ferrites; magnetic thin films; 250 C; EBSD; Fe₃O₄; angular misorientation data; crystallographic orientation analyses; electron backscatter diffraction; magnetite thin films; misorientation boundaries; Annealing; Backscatter; Crystallography; Diffraction; Electrons; Magnetic analysis; Magnetic films; Magnetic materials; Saturation magnetization; Transistors; Crystal growth; electron backscatter diffraction; electron microscopy; magnetite; position measurement;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2006.880079

Filename

1704467