Title :
Crystallographic Orientation Analyses of Magnetite Thin Films Using Electron Backscatter Diffraction (EBSD)
Author :
Koblischka-Veneva, A. ; Koblischka, M.R. ; Mücklich, F. ; Murphy, S. ; Zhou, Y. ; Shvets, I.V.
Author_Institution :
Inst. of Functional Mater., Saarbrucken Univ.
Abstract :
The crystallographic orientation of magnetite (Fe3O4) thin films was measured using electron backscatter diffraction (EBSD). Misorientation boundaries appear in maps of angular misorientation data. The distribution of misorientation angles changes after annealing the samples in air at 250degC. Most small-angle misorientations (<5deg) are removed after one minute of annealing, whereas larger misorientations (as high as 60deg) continue to persist
Keywords :
crystal orientation; electron backscattering; electron diffraction; ferrites; magnetic thin films; 250 C; EBSD; Fe3O4; angular misorientation data; crystallographic orientation analyses; electron backscatter diffraction; magnetite thin films; misorientation boundaries; Annealing; Backscatter; Crystallography; Diffraction; Electrons; Magnetic analysis; Magnetic films; Magnetic materials; Saturation magnetization; Transistors; Crystal growth; electron backscatter diffraction; electron microscopy; magnetite; position measurement;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2006.880079
