• DocumentCode
    765725
  • Title

    Design of a virtual LCR component meter

  • Author

    Evans, W.A. ; Ingersoll, T.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Univ. of Wales, Swansea, UK
  • Volume
    142
  • Issue
    2
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    114
  • Lastpage
    124
  • Abstract
    The paper describes an LCR component meter employing both single-frequency and multifrequency testing of the component. The instrument departs from conventional component-meter practice, where a phase-sensitive detector is used to perform frequency convolution, to one based on the fast-Fourier-transform algorithm. Equivalent circuits of the component are computed at each frequency and displayed on a touch-sensitive window-managed display which forms part of a virtual instrument workstation
  • Keywords
    automatic test equipment; capacitors; electron device testing; fast Fourier transforms; inductors; resistors; virtual machines; component-meter practice; equivalent circuits; fast-Fourier-transform algorithm; frequency convolution; impedance scaling; multifrequency testing; phase-sensitive detector; signal detection; single-frequency testing; touch-sensitive window-managed display; virtual LCR component meter; virtual instrument workstation;
  • fLanguage
    English
  • Journal_Title
    Science, Measurement and Technology, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2344
  • Type

    jour

  • DOI
    10.1049/ip-smt:19951698
  • Filename
    376926