Control of Domain Wall Motion in Permalloy Ring

Author

Chang, C.C. ; Chang, Y.C. ; Lee, C.M. ; Chen, C.C. ; Wu, J.C.

Author_Institution

Nat. Changhua Univ. of Educ.

Volume

42

Issue

10

fYear

2006

Firstpage

2960

Lastpage

2962

Abstract

Domain wall motion through current-induced Oersted field was investigated by magnetic force microscopy, magnetoresistance measurement, and micromagnetic simulation. Microstructured permalloy rings with nonmagnetic control leads were fabricated by means of electron beam lithography. Through variant arrangement of control lead, the generation of uniform and nonuniform Oersted fields on a single element becomes achievable. The movement of the walls within vortex-pair state, clockwise or counterclockwise, was controlled by the Oersted fields

Keywords

Permalloy; electron beam lithography; magnetic domain walls; magnetic force microscopy; magnetic recording; magnetoresistance; micromagnetics; current-induced Oersted field; domain wall motion; electron beam lithography; magnetic force microscopy; magnetic recording; magnetoresistance measurement; micromagnetic simulation; microstructured permalloy rings; nonmagnetic control; Current measurement; Force measurement; Magnetic domain walls; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetoresistance; Micromagnetics; Motion control; Motion measurement; Magnetic force microscopy; magnetic recording; magnetoresistance;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2006.878414

Filename

1704496