DocumentCode
766784
Title
Magnetic Characteristics of CoCr Thin Films on Metallic Under Layer
Author
Sakai, I. ; Sumita, I. ; Nakayama, Y. ; Kouchiyama, A. ; Asanuma, M.
Author_Institution
Matsushita Research Inst. Inc.
Volume
1
Issue
7
fYear
1985
Firstpage
902
Lastpage
904
Abstract
A dc magnetron sputtering device was used to fabricate under layer films of NiFe, Ti, Mo, Ta, and CoZrNb with thicknesses of 0.03-0.3, ¿m and then CoCr films on top with a thickness of 0.2, ¿m under fixed conditions. Comparing VSM and Kerr effect analysis results for these films with similar analyses of CoCr films on PET films, the Hc¿ value was large but the perpendicular anisotropy was small. This is due to the fact that in the columnar structure small grains grow with non-uniform directions disturbing the structure.
Keywords
Anisotropic magnetoresistance; Crystallization; Human computer interaction; Kerr effect; Magnetic devices; Magnetic fields; Magnetic films; Magnetic properties; Positron emission tomography; Sputtering;
fLanguage
English
Journal_Title
Magnetics in Japan, IEEE Translation Journal on
Publisher
ieee
ISSN
0882-4959
Type
jour
DOI
10.1109/TJMJ.1985.4549009
Filename
4549009
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