• DocumentCode
    767194
  • Title

    Applying testability analysis for integrated diagnostics

  • Author

    Sheppard, John W. ; Simpson, William R.

  • Author_Institution
    Arinc Research Corp., Anapolis, MD, USA
  • Volume
    9
  • Issue
    3
  • fYear
    1992
  • Firstpage
    65
  • Lastpage
    78
  • Abstract
    The use of measures that evaluate system testability at a specific time during system design is demonstrated. The measures were detailed in a previous article (see ibid., vol.9, no.1, p.40-54 (1992)). The measures improve testability as part of an interactive process. The objective in applying the testability measures is to minimize ambiguity in replaceable unit groups while minimizing the amount of testing and the number of tests. The problems of excess information provided by a test set, ambiguity arising from deficiencies in the test set, multiple failure, and the test set´s effect on false-alarm tolerance are examined. The analysis techniques are applied to a specific example, the antitank missile launcher, and the ways in which the testability of that system might be improved are discussed.<>
  • Keywords
    automatic testing; built-in self test; fault tolerant computing; antitank missile launcher; false-alarm tolerance; integrated diagnostics; interactive process; replaceable unit groups; system testability; testability analysis; Error correction; Job design; Logic testing; Missiles; Performance analysis; Performance evaluation; Process design; System testing; Time measurement; Tracking loops;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.156160
  • Filename
    156160