DocumentCode
767194
Title
Applying testability analysis for integrated diagnostics
Author
Sheppard, John W. ; Simpson, William R.
Author_Institution
Arinc Research Corp., Anapolis, MD, USA
Volume
9
Issue
3
fYear
1992
Firstpage
65
Lastpage
78
Abstract
The use of measures that evaluate system testability at a specific time during system design is demonstrated. The measures were detailed in a previous article (see ibid., vol.9, no.1, p.40-54 (1992)). The measures improve testability as part of an interactive process. The objective in applying the testability measures is to minimize ambiguity in replaceable unit groups while minimizing the amount of testing and the number of tests. The problems of excess information provided by a test set, ambiguity arising from deficiencies in the test set, multiple failure, and the test set´s effect on false-alarm tolerance are examined. The analysis techniques are applied to a specific example, the antitank missile launcher, and the ways in which the testability of that system might be improved are discussed.<>
Keywords
automatic testing; built-in self test; fault tolerant computing; antitank missile launcher; false-alarm tolerance; integrated diagnostics; interactive process; replaceable unit groups; system testability; testability analysis; Error correction; Job design; Logic testing; Missiles; Performance analysis; Performance evaluation; Process design; System testing; Time measurement; Tracking loops;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/54.156160
Filename
156160
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