Fault observability analysis of analog circuits in frequency domain

Author

Slamani, Mustapha ; Kaminska, Bozena

Author_Institution

Quebec Univ., Montreal, Que., Canada

Volume

43

Issue

2

fYear

1996

fDate

2/1/1996 12:00:00 AM

Firstpage

134

Lastpage

139

Abstract

We study the testability of analog circuits in the frequency domain by introducing the analog fault observability concept. The proposed algorithm indicates the set of adequate test frequencies and test nodes to increase fault observability. This approach combines a structural testing methodology with functionality verification to increase the test effectiveness and consequently the design manufacturability and reliability. We analyze the case of single fault, double, and multiple faults. Concepts such as fault masking, fault dominance, fault equivalence, and non observable fault in analog circuits are defined and then used to evaluate testability. The theoretical aspect is based on the sensitivity approach

Keywords

analogue circuits; circuit analysis computing; circuit testing; fault diagnosis; frequency-domain analysis; observability; analog circuits; analog fault observability; double fault; fault dominance; fault equivalence; fault masking; fault observability analysis; frequency domain; functionality verification; multiple faults; nonobservable fault; sensitivity approach; single fault; structural testing methodology; test frequencies; test nodes; testability; Analog circuits; Circuit analysis; Circuit faults; Circuit testing; Equations; Fault diagnosis; Frequency domain analysis; Manufacturing; Observability; System testing;

fLanguage

English

Journal_Title

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on

Publisher

ieee

ISSN

1057-7130

Type

jour

DOI

10.1109/82.486460

Filename

486460