• DocumentCode
    76801
  • Title

    Ballistic Band-to-Band Tunneling in the OFF State in InGaAs MOSFETs

  • Author

    Basu, Debdeep ; Kotlyar, Roza ; Weber, Cory E. ; Stettler, Mark A.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • Volume
    61
  • Issue
    10
  • fYear
    2014
  • fDate
    Oct. 2014
  • Firstpage
    3417
  • Lastpage
    3422
  • Abstract
    We present quantum transport simulation results for InAs and In0.7Ga0.3As double-gate MOSFETs by using an atomistic full-band basis to evaluate the tunneling currents in the OFF state. While InAs has the advantage of lower mass and higher injection velocity, it also has lower bandgap. For low gate bias, the overlap in energy of the valence band in the channel with the source/drain conduction bands results in band-to-band tunneling (BTBT) between source and drain, which clamps the OFF current. Such current can be reduced by increasing the bandgap of the material either by increasing confinement or by lowering the In content, for example, using In0.7Ga0.3As. Grading the doping of the source/drain region to create a wider barrier also reduces BTBT, but to a lesser extent.
  • Keywords
    III-V semiconductors; MOSFET; ballistic transport; conduction bands; gallium arsenide; indium compounds; tunnelling; InGaAs; atomistic full band basis; ballistic band-to-band tunneling; double gate MOSFET; off state ballistic tunneling; source-drain conduction bands; tunneling current; Doping; Indium gallium arsenide; Logic gates; MOSFET; Photonic band gap; Tunneling; BTBT; III-V semiconductor materials; InAs; InGaAs; MOSFETs; ballistic transport; tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2014.2350912
  • Filename
    6902854