DocumentCode
76801
Title
Ballistic Band-to-Band Tunneling in the OFF State in InGaAs MOSFETs
Author
Basu, Debdeep ; Kotlyar, Roza ; Weber, Cory E. ; Stettler, Mark A.
Author_Institution
Intel Corp., Hillsboro, OR, USA
Volume
61
Issue
10
fYear
2014
fDate
Oct. 2014
Firstpage
3417
Lastpage
3422
Abstract
We present quantum transport simulation results for InAs and In0.7Ga0.3As double-gate MOSFETs by using an atomistic full-band basis to evaluate the tunneling currents in the OFF state. While InAs has the advantage of lower mass and higher injection velocity, it also has lower bandgap. For low gate bias, the overlap in energy of the valence band in the channel with the source/drain conduction bands results in band-to-band tunneling (BTBT) between source and drain, which clamps the OFF current. Such current can be reduced by increasing the bandgap of the material either by increasing confinement or by lowering the In content, for example, using In0.7Ga0.3As. Grading the doping of the source/drain region to create a wider barrier also reduces BTBT, but to a lesser extent.
Keywords
III-V semiconductors; MOSFET; ballistic transport; conduction bands; gallium arsenide; indium compounds; tunnelling; InGaAs; atomistic full band basis; ballistic band-to-band tunneling; double gate MOSFET; off state ballistic tunneling; source-drain conduction bands; tunneling current; Doping; Indium gallium arsenide; Logic gates; MOSFET; Photonic band gap; Tunneling; BTBT; III-V semiconductor materials; InAs; InGaAs; MOSFETs; ballistic transport; tunneling;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2014.2350912
Filename
6902854
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