• DocumentCode
    768404
  • Title

    Dependence of the Magnetization on the Layer Thickness in Compositionally Modulated Fe/Y Thin Films

  • Author

    Morishita, T. ; Togami, Y. ; Tsushima, K.

  • Author_Institution
    NHK Science and Technical Research Laboratories.
  • Volume
    2
  • Issue
    2
  • fYear
    1987
  • Firstpage
    169
  • Lastpage
    170
  • Abstract
    Compositionally modulated thin films of Fe and Y--which normally form an amorphous alloy--were fabricated to investigate the variation in magnetism with the thickness of each layer. It was found that magnetization disappeared at dFe ¿2.4 Å, corresponding to a Fe0.4 Y0.6 composition alloy, agreeing with an Fe-Y amorphous alloy critical composition. When 6 Å ¿ dFe ¿ 12 Å, Mo was almost constant with respect to dFe. The central region of the Fe layer was composed of pure Fe but had reduced magnetization. This structure is peculiar to compositionally modulated films.
  • Keywords
    Amorphous magnetic materials; Amorphous materials; Chemicals; Iron alloys; Magnetic films; Magnetic modulators; Magnetization; Thickness measurement; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Journal_Title
    Magnetics in Japan, IEEE Translation Journal on
  • Publisher
    ieee
  • ISSN
    0882-4959
  • Type

    jour

  • DOI
    10.1109/TJMJ.1987.4549364
  • Filename
    4549364
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=768404