Title :
Design of double-sampling ΣΔ modulation A/D converters with bilinear integrators
Author :
Rombouts, Pieter ; De Maeyer, Jeroen ; Weyten, Ludo
Author_Institution :
Electron. & Inf. Syst. Dept., Ghent Univ., Belgium
fDate :
4/1/2005 12:00:00 AM
Abstract :
Double-sampling techniques allow to double the sampling frequency of a switched capacitor ΣΔ analog-to-digital convertors without increasing the clock frequency. Unfortunately, path mismatch between the double sampling branches may cause noise folding, which could ruin the modulator´s performance. The fully floating double-sampling integrator is an interesting building block to be used in such a double sampling ΣΔ modulator because its operation is tolerant to path mismatch. However, this circuit exhibits an undesired bilinear filter effect. This effectively increases the order of the modulator by one. Due to this, previously presented structures don´t have enough freedom to fully control the modulator pole positions. In this paper, we introduce modified topologies for double-sampling ΣΔ modulators built with bilinear integrators. We show that these architectures provide full control of the modulator pole positions and hence can be used to implement any noise transfer function. Additionally, analytical expressions are obtained for the residual folded noise.
Keywords :
circuit noise; integrating circuits; network topology; sigma-delta modulation; transfer functions; ΣΔ modulation; analog-to-digital convertors; analytical expressions; bilinear filter effect; bilinear integrators; double sampling ΣΔ modulator; double sampling branches; double-sampling A-D converters; fully floating double-sampling integrator; modulator pole position; noise transfer function; path mismatch; residual folded noise; Analog-digital conversion; Capacitors; Circuit noise; Circuit topology; Clocks; Filters; Frequency conversion; Noise shaping; Sampling methods; Transfer functions; Analog-to-digital convertors; double sampling;
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
DOI :
10.1109/TCSI.2005.844233