DocumentCode
769982
Title
Domain characterization of transmission line models and analyses
Author
Gupta, Rohini ; Kim, Seok-Yoon ; Pileggi, Lawrence T.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
Volume
15
Issue
2
fYear
1996
fDate
2/1/1996 12:00:00 AM
Firstpage
184
Lastpage
193
Abstract
Electronic system design requires noise and delay analyses of lossy, low-loss, frequency dependent, and coupled transmission lines, along with lumped parasitic elements. Numerous models and techniques have been developed for simulating these interconnect circuits, however, no single method represents the optimal approach for all transmission line problems. Accuracy and efficiency considerations would suggest the use of different models and analyses for the various types of interconnects. Such an approach to simulating transmission lines requires a measure of goodness for selecting the appropriate model and analysis in terms of the circuit parameters. Toward this goal, this paper presents an efficient methodology for characterizing transmission line models into solution domains. This provides an efficient technique for automatically selecting the type of interconnect model and analysis. Specifically, for a specified acceptable modeling error, analysis domains are established for automatic model selection between the classical method of characteristics, a lumped modeling approach and the state-based convolution technique within a simulation and analysis tool. In general, however, this approach can be applied to any combination of models and analyses, if a measure of accuracy and efficiency can be established
Keywords
VLSI; convolution; delays; integrated circuit interconnections; integrated circuit modelling; transmission line theory; VLSI; automatic model selection; circuit parameters; coupled transmission lines; delay analyses; domain characterization; frequency dependent transmission lines; goodness measure; interconnect circuits; lossy transmission lines; low-loss transmission lines; lumped modeling approach; lumped parasitic elements; modeling error; solution domains; state-based convolution technique; transmission line models; Analytical models; Circuit noise; Circuit simulation; Coupling circuits; Delay; Distributed parameter circuits; Frequency dependence; Integrated circuit interconnections; Propagation losses; Transmission lines;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.486664
Filename
486664
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