DocumentCode
770635
Title
Built-in test maturation concepts using test program set and relational database technologies
Author
Sudolsky, Michael D.
Author_Institution
C-17 Autom. Test Syst., McDonnell Douglas Aerosp., Long Beach, CA, USA
Volume
11
Issue
3
fYear
1996
fDate
3/1/1996 12:00:00 AM
Firstpage
35
Lastpage
40
Abstract
Continual improvement of avionic built-in test (BIT) is critical to mission readiness and capability. This paper discusses how test program set (TPS) and relational database (RDB) technologies can be used for this purpose. Important aspects for continually improving avionic BIT and TPS operation are discussed
Keywords
aircraft testing; automatic testing; military aircraft; relational databases; TPS operation; aircraft testing; avionic built-in test; military aircraft; mission readiness; relational database technologies; test maturation concepts; test program set; Aerospace electronics; Aerospace testing; Automatic testing; Built-in self-test; Circuit testing; Costs; Displays; Military aircraft; Relational databases; System testing;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems Magazine, IEEE
Publisher
ieee
ISSN
0885-8985
Type
jour
DOI
10.1109/62.486735
Filename
486735
Link To Document