Title :
Micro-Kerr Loops of CoZr Stripe Pattern
Author :
Yasuda, K. ; Tago, A. ; Toshima, T.
Author_Institution :
NTT.
Abstract :
M-H loops were measured at different points in Co-Zr stripes of varying widths (W = 20 to 100 ¿m) using micro-Kerr effect measuring equipment. The M-H loops obtained were biased with respect to the applied field when W ¿ 50 ¿m, and the rising and falling edges of loops were partially inverted when W ¿ 70 ¿m. Loops were used to compute the number of magnetic domains, and fair agreement with Bitter domain observations was obtained, indicating that domain information can be obtained by this method without sample contamination, as in the Bitter method.
Keywords :
Conductive films; Contamination; Length measurement; Magnetic domains; Magnetic field measurement; Magnetics Society; Pollution measurement; Rotation measurement; Shape; Thickness measurement;
Journal_Title :
Magnetics in Japan, IEEE Translation Journal on
DOI :
10.1109/TJMJ.1987.4549693