DocumentCode
772216
Title
Improved method to extract the short-circuit parameters of the BECM
Author
Ngo, Khai D T ; Gangupomu, Ajay
Author_Institution
Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
Volume
1
Issue
1
fYear
2003
fDate
3/1/2003 12:00:00 AM
Firstpage
17
Lastpage
18
Abstract
The current method for extracting the short-circuit broadband extended cantilever model (BECM) parameters requires measurement of short-circuit currents, and is problematic over a wide frequency range, prohibiting each short-circuit parameter to be directly measured. The improved method presented herein eliminates the measurements of short-circuit currents. Each short-circuit BECM parameter is directly found from two measurements, an open-circuit voltage gain and a short-circuit admittance. The method is demonstrated for a published five-winding BECM.
Keywords
electric admittance; electric current measurement; magnetic circuits; short-circuit currents; transformer windings; broadband extended cantilever model; broadband winding model; magnetic windings; open-circuit voltage gain; short-circuit admittance; short-circuit currents measurement; short-circuit parameters; transformer windings; winding model; Admittance measurement; Current measurement; Electrochemical machining; Frequency measurement; Gain measurement; Impedance measurement; Sensor phenomena and characterization; Soldering; Voltage measurement; Windings;
fLanguage
English
Journal_Title
Power Electronics Letters, IEEE
Publisher
ieee
ISSN
1540-7985
Type
jour
DOI
10.1109/LPEL.2003.813479
Filename
1225182
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