• DocumentCode
    772216
  • Title

    Improved method to extract the short-circuit parameters of the BECM

  • Author

    Ngo, Khai D T ; Gangupomu, Ajay

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Florida Univ., Gainesville, FL, USA
  • Volume
    1
  • Issue
    1
  • fYear
    2003
  • fDate
    3/1/2003 12:00:00 AM
  • Firstpage
    17
  • Lastpage
    18
  • Abstract
    The current method for extracting the short-circuit broadband extended cantilever model (BECM) parameters requires measurement of short-circuit currents, and is problematic over a wide frequency range, prohibiting each short-circuit parameter to be directly measured. The improved method presented herein eliminates the measurements of short-circuit currents. Each short-circuit BECM parameter is directly found from two measurements, an open-circuit voltage gain and a short-circuit admittance. The method is demonstrated for a published five-winding BECM.
  • Keywords
    electric admittance; electric current measurement; magnetic circuits; short-circuit currents; transformer windings; broadband extended cantilever model; broadband winding model; magnetic windings; open-circuit voltage gain; short-circuit admittance; short-circuit currents measurement; short-circuit parameters; transformer windings; winding model; Admittance measurement; Current measurement; Electrochemical machining; Frequency measurement; Gain measurement; Impedance measurement; Sensor phenomena and characterization; Soldering; Voltage measurement; Windings;
  • fLanguage
    English
  • Journal_Title
    Power Electronics Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1540-7985
  • Type

    jour

  • DOI
    10.1109/LPEL.2003.813479
  • Filename
    1225182