• DocumentCode
    772363
  • Title

    A Transistorized Fail-Safe High-Low Trip

  • Author

    Kella, J. ; Rosen, S.

  • Author_Institution
    AEC of Israel Tel-Aviv, Israel
  • Volume
    11
  • Issue
    2
  • fYear
    1964
  • fDate
    4/1/1964 12:00:00 AM
  • Firstpage
    24
  • Lastpage
    27
  • Abstract
    The paper describes a novel transistorized trip circuit which was designed according to A.C. fail safe principles, the circuit trips being on high and low levels, thus indicating off normal input conditions. Both levels are detected by a single regenerative comparator. The output decays within 3 msec after a trip condition, independent of input signal slope or level. The circuit posseses an inherent static trip state lock.
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1964.4323382
  • Filename
    4323382
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=772363