• DocumentCode
    772368
  • Title

    Dual Experimental Approach for Thermal Impacts on Electromagnetic Behavior of Electronic Circuit Board Configurations

  • Author

    Dienot, Jean-Marc ; Batista, Emmanuel ; Bernard, Michel

  • Author_Institution
    Dept. of Electr. & Data Process. Eng., Univ. Inst. of Technol., Tarbes
  • Volume
    57
  • Issue
    11
  • fYear
    2008
  • Firstpage
    2405
  • Lastpage
    2413
  • Abstract
    Some effects of physical parameters, such as temperature, on electromagnetic emission or susceptibility of electronic circuit boards are nonnegligible and can be enforced by new integrated complex electronic structures. This paper describes experimental improvements proposed on near-field and radiated-mode test setups, including the temperature parameter. New experimental investigations and methodology are driven to estimate the real external thermal impacts on electromagnetic behavior and compliance. With pertinent characterization results, a review of wideband frequency modifications of electromagnetic compatibility (EMC) responses on electronic configurations with active digital devices and a printed circuit board (PCB) wire network is presented and analyzed.
  • Keywords
    electromagnetic compatibility; printed circuit testing; printed circuits; EMC; PCB; active digital devices; electromagnetic compatibility; electromagnetic emission; electromagnetic susceptibility; electronic circuit boards; integrated complex electronic structures; near-field test setups; printed circuit board; radiated-mode test setups; temperature effects; thermal impacts; wire network; Characterization; electromagnetic compatibility (EMC); electromagnetic field; printed circuit board (PCB); radiated mode; temperature; test setup; thermal impact;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2008.926379
  • Filename
    4549866